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Reflective Imaging Optics Using Concave and Convex Mirrors for a Compact and Achromatic Full-field X-ray Microscope.

Published online by Cambridge University Press:  10 August 2018

Jumpei Yamada ,
Satoshi Matsuyama ,
Kentaro Hata ,
Raita Hirose ,
Yoshihiro Takeda ,
Yoshiki Kohmura ,
Makina Yabashi ,
Kazuhiko Omote ,
Tetsuya Ishikawa  and
Kazuto Yamauchi
Jumpei Yamada*
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka565-0871, Japan.
Satoshi Matsuyama
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka565-0871, Japan.
Kentaro Hata
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka565-0871, Japan.
Raita Hirose
Affiliation:
X-Ray Research Laboratory, Rigaku Corp., 3-9-12 Matsubara-cho, Akishima, Tokyo196-8666, Japan.
Yoshihiro Takeda
Affiliation:
X-Ray Research Laboratory, Rigaku Corp., 3-9-12 Matsubara-cho, Akishima, Tokyo196-8666, Japan.
Yoshiki Kohmura
Affiliation:
SPring-8/RIKEN, 1-1-1 Kouto, Sayo, Hyogo679-5198, Japan.
Makina Yabashi
Affiliation:
SPring-8/RIKEN, 1-1-1 Kouto, Sayo, Hyogo679-5198, Japan.
Kazuhiko Omote
Affiliation:
X-Ray Research Laboratory, Rigaku Corp., 3-9-12 Matsubara-cho, Akishima, Tokyo196-8666, Japan.
Tetsuya Ishikawa
Affiliation:
SPring-8/RIKEN, 1-1-1 Kouto, Sayo, Hyogo679-5198, Japan.
Kazuto Yamauchi
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka565-0871, Japan.
*
* Corresponding author, [email protected]

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 274 - 275
Copyright
© Microscopy Society of America 2018 

References

[1] Kodama, R., et al, Opt. Lett. 21, 1321 1996.Google Scholar
[2] Sauneuf, R., et al, Rev. Sci. Instrum. 68, 3421 1997.Google Scholar
[3] Matsuyama, S., et al, Sci. Rep. 7, 46358 2017.Google Scholar
[4] Yamada, J., et al, Appl. Opt. 56(4), 967 2017.CrossRefGoogle Scholar
[5] Yamada, J., et al, Proc. SPIE 10386, 10386C 2017.Google Scholar