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Reducing Supervision of Quantitative Image Analysis of Meteorite Samples

Published online by Cambridge University Press:  20 December 2019

Ellen J. Crapster-Pregont  and
Denton S. Ebel
Ellen J. Crapster-Pregont*
Affiliation:
Lamont-Doherty Earth Observatory, Columbia University, Palisades, NY10964, USA Department of Earth and Planetary Science, American Museum of Natural History, Central Park West at 79th Street, New York, NY10024, USA
Denton S. Ebel
Affiliation:
Lamont-Doherty Earth Observatory, Columbia University, Palisades, NY10964, USA Department of Earth and Planetary Science, American Museum of Natural History, Central Park West at 79th Street, New York, NY10024, USA
*
*Author for correspondence: Ellen J. Crapster-Pregont, E-mail: [email protected]
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Abstract

When selecting a method for determining modal mineralogy and elemental composition of geological samples (e.g., meteorites), a number of factors should be considered, includingthe number of objects or the area to be analyzed; the scale of expected chemical variation; instrument time restrictions; and post-processing time. This study presents a method that minimizes acquisition time while maintaining the ability to distinguish minerals based on combinations of intensities of electron probe micro-analyzer-generated X-ray element maps. While some other methods yield similar outcomes, this method's post-processing utilizes standard parameterized, X-ray intensity “map math” in an algorithm that is adaptable and requires minimal supervision once implemented. This study's minimized supervision in the post-processing of X-ray intensity maps decreases analysis time and its adaptability increases the number of potential applications. The method also facilitates calibration of the exact locations of analysis using laser ablation methods. While the method described here has advantages, the choice of method always depends on the question being asked.

Keywords

chondriteEPMAphase analysisquantitative image analysisX-ray intensity
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 26 , Issue 1 , February 2020 , pp. 63 - 75
Copyright
Copyright © Microscopy Society of America 2019

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