Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-02T20:33:30.623Z Has data issue: false hasContentIssue false
  • English
  • Français

Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

Tim Dahmen ,
Holger Kohr ,
Niels de Jonge  and
Philipp Slusallek
Tim Dahmen
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), 66123 Saarbrucken, Germany
Holger Kohr
Affiliation:
KTH Royal Institute of Technology, Dep. of Mathematics, Lindstedtsvagen 25, Stockholm, SE 100 44
Niels de Jonge
Affiliation:
INM - Leibniz Institute for New Materials, 66123 Saarbrucken, Germany Email of the presenting author: [email protected]
Philipp Slusallek
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), 66123 Saarbrucken, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2337 - 2338
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Dahmen, T & Kohr, H, N deJonge and P Slusallek. Microsc. Microanal. 20 (2014). pp. 548–560.Google Scholar
[2] Hovden, R, et al, Ultramicroscopy 140 (2014). pp. 26–31.Google Scholar
[3] Dahmen, T, et al "Matched Backprojection Operator for Combined Scanning Transmission Electron Tilt- and Focal Series" under review. Microsc. Microanal. (2015).Google Scholar