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Recent Reconstruction Developments in IVAS

Published online by Cambridge University Press:  04 August 2017

Brian P. Geiser ,
Francois Vurpillot ,
Yimeng Chen ,
Katherine P. Rice ,
Stuart Wright ,
David A. Reinhard ,
Geoff Sobering ,
Robert M. Ulfig  and
David J. Larson
Brian P. Geiser
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
Francois Vurpillot
Affiliation:
Groupe de Physique des Matériaux, UMR CNRS 6634, Université et INSA de Rouen, France.
Yimeng Chen
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
Katherine P. Rice
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
Stuart Wright
Affiliation:
EDAX, Draper, UT, 84020USA.
David A. Reinhard
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
Geoff Sobering
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
Robert M. Ulfig
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.
David J. Larson
Affiliation:
CAMECA Instruments Inc., Madison, WI, 53711USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 638 - 639
Copyright
© Microscopy Society of America 2017 

References

[1] The authors acknowledge funding from the Recherche Technologique de Base (RTB) and the French National Agency (Project no. APTITUDE ANR-12-NANO-0001).Google Scholar
[2] Vurpillot, F., Gaillard, A., DaCosta, G. & Deconihout, B. Ultramicroscopy 132 2013 152–157.CrossRefGoogle Scholar
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[4] Adams, B. L., Wright, S. I. & Kunze, K. Metallurgical Transactions A 24(no. 4 1993 819–831.CrossRefGoogle Scholar