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Recent Innovations and Perspectives in TOF-SIMS

Published online by Cambridge University Press:  22 July 2022

Felix Kollmer*
Affiliation:
IONTOF GmbH, Muenster, Germany
Alexander Pirkl
Affiliation:
IONTOF GmbH, Muenster, Germany
Henrik Arlinghaus
Affiliation:
IONTOF GmbH, Muenster, Germany
Rudolf Möllers
Affiliation:
IONTOF GmbH, Muenster, Germany
Nathan Havercroft
Affiliation:
IONTOF Inc., Chestnut Ridge, NY, United States.
Ewald Niehuis
Affiliation:
IONTOF GmbH, Muenster, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Copyright
Copyright © Microscopy Society of America 2022

References

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