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Recent Developments in Laboratory X-ray Microanalytical Techniques for Electronic Structure, Chemical Composition, and Microstructure of Metals and Materials

Published online by Cambridge University Press:  30 July 2020

Sylvia Lewis ,
Jeff Gelb ,
S.H. Lau ,
Wenbing Yun ,
David Vine ,
Benjamin Stripe  and
Srivatsan Seshadri
Sylvia Lewis
Affiliation:
Sigray, Inc., Concord, California, United States
Jeff Gelb
Affiliation:
Sigray, Inc., Concord, California, United States
S.H. Lau
Affiliation:
Sigray, Inc., Concord, California, United States
Wenbing Yun
Affiliation:
Sigray, Inc., Concord, California, United States
David Vine
Affiliation:
Sigray, Inc., Concord, California, United States
Benjamin Stripe
Affiliation:
Sigray, Inc., Concord, California, United States
Srivatsan Seshadri
Affiliation:
Sigray, Inc., Concord, California, United States

Abstract

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Type
X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 516
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Copyright
Copyright © Microscopy Society of America 2020

References

Balerna, A, Mobilio, S. Synchrotron Radiations: Basics, Methods and Applications. Germany: Springer; 2015;1:3–27Google Scholar
Bharti, A and Goyal, N. “Fundamental of Synchrotron Radiations,” Synchrotron Radiation - Useful and Interesting Applications. 2018.Google Scholar