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Real-World Electron Detector Performance in Scanning Electron Microscopes

Published online by Cambridge University Press:  25 July 2016

Owen E. Healy  and
Richard B. Mott
Owen E. Healy
Affiliation:
PulseTor LLC, 1580 Reed Road, Suite C2, Pennington NJ
Richard B. Mott
Affiliation:
PulseTor LLC, 1580 Reed Road, Suite C2, Pennington NJ

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 596 - 597
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Joy, D. C., Joy, C. S. & Bunn, R. D. Scanning 18 (1996) 533–538.CrossRefGoogle ScholarPubMed
[2] Bok, J. & Schauer, P. Scanning 36 (2014) 384–393.Google Scholar