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Real-space Demonstration of 0.4 Angstrom Resolution at 80 keV via Electron Ptychography with a High Dynamic Range Pixel Array Detector

Published online by Cambridge University Press:  01 August 2018

Zhen Chen ,
Yi Jiang ,
Yimo Han ,
Pratiti Deb ,
Hui Gao ,
Saien Xie ,
Prafull Purohit ,
Mark W. Tate ,
Jiwoong Park  and
Sol M. Gruner
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Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY
Yimo Han
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY
Pratiti Deb
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY Department of Physics, Cornell University, Ithaca, NY
Hui Gao
Affiliation:
Department of Chemistry, Institute for Molecular Engineering, and James Franck Institute, University of Chicago, Chicago, IL Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY
Saien Xie
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY Department of Chemistry, Institute for Molecular Engineering, and James Franck Institute, University of Chicago, Chicago, IL
Prafull Purohit
Affiliation:
Department of Physics, Cornell University, Ithaca, NY
Mark W. Tate
Affiliation:
Department of Physics, Cornell University, Ithaca, NY
Jiwoong Park
Affiliation:
Department of Chemistry, Institute for Molecular Engineering, and James Franck Institute, University of Chicago, Chicago, IL
Sol M. Gruner
Affiliation:
Department of Physics, Cornell University, Ithaca, NY Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY
Veit Elser
Affiliation:
Department of Physics, Cornell University, Ithaca, NY
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 194 - 195
Copyright
© Microscopy Society of America 2018 

References

[1] Erni, R., et al, Phys. Rev. Lett. 102 2009) p. 096101.Google Scholar
[2] Sawada, H., et al, Microscopy 64 2012) p. 213.Google Scholar
[3] Tate, M. W., et al, Microscopy and Microanalysis 22 2016) p. 237.Google Scholar
[4] Maiden, A., et al, Ultramicroscopy 109 2009) p. 1256.Google Scholar
[5] Jiang, Y., et al arXiv: 1801.04630..Google Scholar
[6] Research supported by NSF (DMR-1539918, DMR-1429155, DMR-1719875) & DOE (DE-SC0005827).Google Scholar