Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-28T19:57:53.300Z Has data issue: false hasContentIssue false
  • English
  • Français

A Readily-automated Scheme for Estimating the Critical Dose of Beam-Sensitive Materials

Published online by Cambridge University Press:  22 July 2022

Robert Colby
Robert Colby*
Affiliation:
Corporate Strategic Research, ExxonMobil Research and Engineering Company, Annandale, NJ

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2236 - 2237
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Egerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. (Springer US, 2011).CrossRefGoogle Scholar
De la Pena, F., Prestat, E., Fauske, V. T., Burdet, P. hyperspy/hyperspy: HyperSpy v1.5.2. (2019).Google Scholar