Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-03T08:26:31.731Z Has data issue: false hasContentIssue false
  • English
  • Français

Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Microstructural Characterization with NIST Lispix

Published online by Cambridge University Press:  05 August 2007

D Newbury ,
D Bright ,
JH Scott ,
J Michael  and
P Kotula
D Newbury
Affiliation:
National Institute of Standards and Technology
D Bright
Affiliation:
National Institute of Standards and Technology
JH Scott
Affiliation:
National Institute of Standards and Technology
J Michael
Affiliation:
Sandia National Laboratories
P Kotula
Affiliation:
Sandia National Laboratories
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1340 - 1341
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)