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Rapid Measurement of I-V Curves via Complete Information Acquisition

Published online by Cambridge University Press:  04 August 2017

S. Somnath
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN
P. Maksymovych
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN
S. V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN
S. Jesse
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN
R. K. Vasudevan
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge TN

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Belianinov, A, Kalinin, SV & Jesse, S Nat. Commun. 6 2015). p. 6650.Google Scholar
[2] Meyer, R, et al, Appl. Phys. Lett. 86 2005). p. 142907.CrossRefGoogle Scholar
[3] Martin, S, et al, Rev. Sci. Instr. 88 2017). p. 023901.Google Scholar
[4] Komoto, Y, et al, Scientific Reports 6 2016). p. 26606.Google Scholar
[5] This research was sponsored by the Division of Materials Sciences and Engineering, BES, DOE (RKV, SVK, PM, SS). This research was conducted and partially supported (SJ) at the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility.Google Scholar