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Rapid and Semi-automated Method for Analysis of the Number of Atoms of Ultra-small Platinum Clusters on Carbon

Published online by Cambridge University Press:  07 August 2002

J.C. Yang ,
S. Bradley  and
J.M. Gibson
J.C. Yang*
Affiliation:
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801
S. Bradley
Affiliation:
UOP LLC, 50 East Algonquin Road, Des Plaines, IL 60017
J.M. Gibson
Affiliation:
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801
*
*Corresponding author, at Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA 15261.
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Abstract

Very high angle (~100 mrad) annular dark-field (HAADF) images in a dedicated scanning transmission electron microscope (STEM) can be used to quantitatively measure the number of atoms in a cluster on a support material. We have developed a computer program which will automatically find the location of the particles and then integrate the intensity to find the number of atoms per cluster. We have examined ultra-small Pt clusters on a C substrate by this novel mass-spectroscopic technique. We discovered that the Pt clusters maintain their three-dimensional shape, and are probably spherical.

Keywords

platinummetal clustershigh angle annular dark-fieldquantificationscanning transmission electron microscopecatalysisnanoparticles
Type
Research Article
Information
Microscopy and Microanalysis , Volume 6 , Issue 4 , July 2000 , pp. 353 - 357
Copyright
Copyright © Microscopy Society of America 2000

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Footnotes

J.M. Gibson is now at Materials Science Division, Argonne National Laboratory, Argonne, IL 60439.