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Raman Microprobe Study of the Visible and Near-Infrared Excited Fluorescence Spectra of Glasses Examined as Potential Raman Intensity Calibration Standards

Published online by Cambridge University Press:  02 July 2020

Edgar S. Etz ,
Steven J. Choquette ,
Wilbur S. Hurst  and
Douglas H. Blackburn
Edgar S. Etz
Affiliation:
Chemical Science and Technology Laboratory, NIST, Gaithersburg, MD, 20899-0001, U.S.A.
Steven J. Choquette
Affiliation:
Chemical Science and Technology Laboratory, NIST, Gaithersburg, MD, 20899-0001, U.S.A.
Wilbur S. Hurst
Affiliation:
Chemical Science and Technology Laboratory, NIST, Gaithersburg, MD, 20899-0001, U.S.A.
Douglas H. Blackburn
Affiliation:
Chemical Science and Technology Laboratory, NIST, Gaithersburg, MD, 20899-0001, U.S.A.
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Extract

In previous work with the Raman microprobe, we have examined the fluorescence emissions of rareearth (RE) bearing glasses to study the phenomena of structural resonances in the spectra of glass microspheres and the energy upconversion processes for RE ions in such glasses that give rise to anti- Stokes fluorescence emission. Presently, we are revisiting these same fluorescent glasses to study their laser excited emissions as potential radiometric sources for the calibration of Raman spectral intensities. Many of the rare earth ions produce interesting fluorescence spectra on laser excitation depending on the type of ordered or disordered (solid) host matrix. These fluorescence spectra, depending on RE concentration and quenching effects, can be intense and may consist of either narrow-band (or line) emissions or broad-band spectra covering a wide spectral range. These spectra, acquired at laser wavelengths from the ultraviolet (UV) to the near-infrared (NIR), provide a practical means for the calibration of Raman instrumentation for both Raman frequency and intensity.

Type
Microscopy and Microanalysis in the “Real World”
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 508 - 509
Copyright
Copyright © Microscopy Society of America

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References

References:

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