Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-25T04:58:34.047Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative X-Ray Mapping in the TEM for Nanotechnology

Published online by Cambridge University Press:  01 August 2004

Patrick Camus  and
Minoru Suzuki
Patrick Camus
Affiliation:
Thermo Electron, Middleton, Wisconsin
Minoru Suzuki
Affiliation:
Thermo Electron, Middleton, Wisconsin
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 542 - 543
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)