Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-24T14:53:47.383Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Simulation of Four-dimensional STEM Datasets

Published online by Cambridge University Press:  30 July 2020

Andreas Beyer ,
Saleh Firoozabadi ,
Damien Heimes ,
Pirmin Kükelhan ,
Tim Grieb ,
Florian Krause ,
Marco Schowalter ,
Hoel Laurent Robert ,
Knut Müller-Caspary  and
Andreas Rosenauer
...Show all authors
Andreas Beyer
Affiliation:
Faculty of Physics and Materials Sciences Center, Philipps-Universität Marburg, Marburg, Hessen, Germany
Saleh Firoozabadi
Affiliation:
Faculty of Physics and Materials Sciences Center, Philipps-Universität Marburg, Marburg, Hessen, Germany
Damien Heimes
Affiliation:
Faculty of Physics and Materials Sciences Center, Philipps-Universität Marburg, Marburg, Hessen, Germany
Pirmin Kükelhan
Affiliation:
Faculty of Physics and Materials Sciences Center, Philipps-Universität Marburg, Marburg, Hessen, Germany
Tim Grieb
Affiliation:
Universität Bremen, Germany Institut für Festkörperphysik Department for Electron Microscopy, Bremen, Bremen, Germany
Florian Krause
Affiliation:
Universität Bremen, Germany Institut für Festkörperphysik Department for Electron Microscopy, Bremen, Bremen, Germany
Marco Schowalter
Affiliation:
Universität Bremen, Germany Institut für Festkörperphysik Department for Electron Microscopy, Bremen, Bremen, Germany
Hoel Laurent Robert
Affiliation:
Forschungszentrum Jülich, Jülich, Nordrhein-Westfalen, Germany
Knut Müller-Caspary
Affiliation:
Forschungszentrum Jülich, Jülich, Nordrhein-Westfalen, Germany
Andreas Rosenauer
Affiliation:
Universität Bremen, Germany Institut für Festkörperphysik Department for Electron Microscopy, Bremen, Bremen, Germany
Kerstin Volz
Affiliation:
Faculty of Physics and Materials Sciences Center, Philipps-Universität Marburg, Marburg, Hessen, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 250 - 251
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Beyer, A., Belz, J., Knaub, N., Jandieri, K. & Volz, K. (2016). Influence of spatial and temporal coherences on atomic resolution high angle annular dark field imaging. Ultramicroscopy 169, 1–10. http://linkinghub.elsevier.com/retrieve/pii/S0304399116300845.10.1016/j.ultramic.2016.06.006CrossRefGoogle ScholarPubMed
Müller-Caspary, K., Oppermann, O., Grieb, T., Krause, F. F., Rosenauer, A., Schowalter, M., Mehrtens, T., Beyer, A., Volz, K. & Potapov, P. (2016). Materials characterisation by angle-resolved scanning transmission electron microscopy. Scientific Reports 6, 37146. http://www.nature.com/articles/srep37146.10.1038/srep37146CrossRefGoogle ScholarPubMed
Oelerich, J. O., Duschek, L., Belz, J., Beyer, A., Baranovskii, S. D. & Volz, K. (2017). STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimens. Ultramicroscopy 177, 91–96. http://linkinghub.elsevier.com/retrieve/pii/S030439911630300X.10.1016/j.ultramic.2017.03.010CrossRefGoogle ScholarPubMed
Ophus, C. (2019). Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond. Microscopy and Microanalysis 1–20. https://www.cambridge.org/core/product/identifier/S1431927619000497/type/journal_article.Google ScholarPubMed
Rosenauer, A. & Schowalter, M. (2008). STEMSIM - A New Software Tool for Simulation of STEM. Microscopy of Semiconducting Materials 2007 120, 170–172. http://www.springerlink.com/index/j2344u6684318134.pdf (Accessed December 8, 2011).10.1007/978-1-4020-8615-1_36CrossRefGoogle Scholar