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Quantitative Relation Between Differential Phase Contrast Images Obtained by Segmented and Pixelated Detectors

Published online by Cambridge University Press:  04 August 2017

Takehito Seki ,
Gabriel Sanchez-Santolino ,
Ryo Ishikawa ,
Yuichi Ikuhara  and
Naoya Shibata
Takehito Seki
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Gabriel Sanchez-Santolino
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo, Japan Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 440 - 441
Copyright
© Microscopy Society of America 2017 

References

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[4] Close, R., et al, Ultramicroscopy 159 2015). p. 124.CrossRefGoogle Scholar
[5] This work was supported by SENTAN, JST..Google Scholar