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Quantitative Field-Emission Transmission Electron Microscopic Study of Domain Boundaries in Cerium Doped A-Sialon Materials

Published online by Cambridge University Press:  02 July 2020

F. Xu ,
Y. Bando ,
C. Wang  and
M. Mitomo
F. Xu
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba City, Ibaraki, 305-0044, Japan
Y. Bando
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba City, Ibaraki, 305-0044, Japan
C. Wang
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba City, Ibaraki, 305-0044, Japan
M. Mitomo
Affiliation:
National Institute for Research in Inorganic Materials, Tsukuba City, Ibaraki, 305-0044, Japan
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Abstract

α-sialon is the isostructural derivative based on the a-silicon nitride (α-Si3N4) structure by partial replacement of Si by Al and N by O. The structure is considered to be stabilized by the incorporation into the large interstices (r=0.146nm) of a metal like Li, Mg, Ca and most small rareearths. Large rare-earth metal ions have been considered not to be able to enter the interstices in α-sialon structure until several recent successes in accommodating large cerium ions (r=0.103nm). This gives rise to questions of the location and distribution of these large cerium ions within the asialon structure. It has been found that α-sialon grains formed in Ce-Si-Al-O-N system are usually rich in a new structural defect which has been considered to be initiated specifically by the presence of cerium in the lattice. This new intergrown defect is identified as domain boundary in our present study by transmission electron microscopy (TEM).

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 248 - 249
Copyright
Copyright © Microscopy Society of America 2001

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References

1.Ekström, T. et al., J. Eur. Ceram. Soc, 8 (1991)3CrossRefGoogle Scholar
2.Xu, F. F. et al., Phil. Mag. A, in pressGoogle Scholar