Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-27T12:11:52.526Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Examination of Reverse-Biased Semiconductor Devices using Off- Axis Electron Holography

Published online by Cambridge University Press:  01 August 2002

A.C. Twitchett ,
R.E. Dunin-Borkowski  and
P.A. Midgley
A.C. Twitchett
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK
R.E. Dunin-Borkowski
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK
P.A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 518 - 519
Copyright
Copyright © Microscopy Society of America 2002