Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-29T23:58:52.999Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Determination of Chemical Composition of Multinary III/V Semiconductors With Sublattice Resolution Using Aberration Corrected HAADF-STEM

Published online by Cambridge University Press:  23 September 2015

Andreas Beyer ,
Nikolai Knaub  and
Kerstin Volz
Andreas Beyer
Affiliation:
Philipps-Universitat Marburg, Faculty of Physics and Materials Science Center, 35032 Marburg, Germany
Nikolai Knaub
Affiliation:
Philipps-Universitat Marburg, Faculty of Physics and Materials Science Center, 35032 Marburg, Germany
Kerstin Volz
Affiliation:
Philipps-Universitat Marburg, Faculty of Physics and Materials Science Center, 35032 Marburg, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2081 - 2082
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Kunert, B., Volz, K., Koch, J. & Stolz, W., Appl. Phys. Lett 88 (2006). p 182108.Google Scholar
[2] Grieb, T., et al., Microsc. Microanal 20 (2014). pp 1740–1752.Google Scholar
[3] Rosenauer, A. & Schowalter, M., Microsc. Semicond. Mater 2007(120 (2008). pp 170–172.Google Scholar
[4] Galindo, P. L., et al., Ultrarmcroscopy 107 (2007). pp 1186–1193.Google Scholar
[5] The authors acknowledge funding from the DFG in the framework of GRK 1782 (functionalisation of semiconductors).Google Scholar