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Quantitative Convergent Beam Electron Diffraction for Simultaneous Structure Factor and Debye Waller Factor Determination - Fitting Method Optimization

Published online by Cambridge University Press:  01 August 2010

X Sang ,
A Kulovits  and
JMK Wiezorek
X Sang
Affiliation:
University of Pittsburgh
A Kulovits
Affiliation:
University of Pittsburgh
JMK Wiezorek
Affiliation:
University of Pittsburgh

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 938 - 939
Copyright
Copyright © Microscopy Society of America 2010