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Quantitative Comparison of Phase Contrast Imaging in Conventional TEM Focal Series and STEM Ptychography

Published online by Cambridge University Press:  25 July 2016

Emanuela Liberti ,
Hao Yang ,
Gerardo Martinez ,
Peter Nellist  and
Angus Kirkland
Emanuela Liberti
Affiliation:
University of Oxford, Department of Materials, Parks Rd, Oxford, UK
Hao Yang
Affiliation:
Lawrence Berkeley National Laboratory, National Center for Electron Microscopy, Molecular Foundry, 1 Cyclotron Rd, Berkeley, CA, USA
Gerardo Martinez
Affiliation:
University of Oxford, Department of Materials, Parks Rd, Oxford, UK
Peter Nellist
Affiliation:
University of Oxford, Department of Materials, Parks Rd, Oxford, UK
Angus Kirkland
Affiliation:
University of Oxford, Department of Materials, Parks Rd, Oxford, UK

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 922 - 923
Copyright
© Microscopy Society of America 2016 

References

References:

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[8] The authors acknowledge funding from the European Union Seventh Framework Programme under Grant Agreement 312483-ESTEEM2 (Integrated Infrastructure Initiative-I3) and from the EPSRC under grant number EP/M010708/1.Google Scholar