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Quantitative Characterization of Grain Structure and Orientation using Electron Back-Scattered Diffraction Patterns Collected by Serial Sectioning

Published online by Cambridge University Press:  01 August 2005

M Groeber ,
Y Bhandari ,
M D Uchic ,
D Dimiduk  and
S Ghosh
M Groeber
Affiliation:
The Ohio State University
Y Bhandari
Affiliation:
The Ohio State University
M D Uchic
Affiliation:
Air Force Research Laboratory
D Dimiduk
Affiliation:
Air Force Research Laboratory
S Ghosh
Affiliation:
The Ohio State University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1626 - 1627
Copyright
© 2005 Microscopy Society of America