Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-07T23:01:25.149Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Characterisation of Surfaces and Defects on PtRu Nanoparticles Using Combined Exit Wave Restoration and Aberration-Corrected TEM

Published online by Cambridge University Press:  03 August 2008

LY Chang ,
C Maunders ,
EA Baranova ,
C Bock  and
GA Botton
LY Chang
Affiliation:
McMaster University, Canada
C Maunders
Affiliation:
McMaster University, Canada
EA Baranova
Affiliation:
National Research Council, Canada
C Bock
Affiliation:
National Research Council, Canada
GA Botton
Affiliation:
McMaster University, Canada
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 426 - 427
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)