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Quantitative Assessment and Measurement of X-ray Detector Performance and Solid Angle in the Analytical Electron Microscope

Published online by Cambridge University Press:  09 December 2021

Nestor J. Zaluzec Open the ORCID record for Nestor J. Zaluzec [Opens in a new window]
Nestor J. Zaluzec*
Affiliation:
Argonne National Laboratory, Photon Science Directorate, Argonne, IL 60439, USA
*
*E-mail: [email protected]
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Abstract

A wide range of X-ray detectors and geometries are available today on transmission/scanning transmission analytical electron microscopes. While there have been numerous reports of their individual performance, no single experimentally reproducible metric has been proposed as a basis of comparison between the systems. In this paper, we detail modeling, experimental procedures, measurements, and specimens which can be used to provide a manufacturer-independent assessment of the performance of an analytical system. Using these protocols, the geometrical collection efficiency, system peaks, and minimum detection limits can be independently assessed and can be used to determine the best conditions to conduct modern hyperspectral and/or spectrally resolved tomographic analyses for an individual instrument. A simple analytical formula and specimen is presented which after suitable system calibrations can be used to experimentally determine the X-ray detector solid angle.

Keywords

AEMSDDSi(Li)Solid AngleXEDS
Type
Software and Instrumentation
Information
Microscopy and Microanalysis , Volume 28 , Issue 1 , February 2022 , pp. 83 - 95
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

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