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Quantitative Annular Dark-Field Imaging at Atomic Resolution

Published online by Cambridge University Press:  25 July 2016

Shunsuke Yamashita ,
Shogo Koshiya ,
Kazuo Ishizuka  and
Koji Kimoto
Shunsuke Yamashita
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan Department of Applied Chemistry, Kyushu University, 1-1 Namiki, Tsukuba, Ibaraki, Japan
Shogo Koshiya
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan
Kazuo Ishizuka
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan HREM Research Inc., 14-48 Matsukazedai, Higashimatsuyama, Saitama, Japan
Koji Kimoto
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, Japan Department of Applied Chemistry, Kyushu University, 1-1 Namiki, Tsukuba, Ibaraki, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 304 - 305
Copyright
© Microscopy Society of America 2016 

References

References:

[1] LeBeau, J M & Stemmer, S Ultramicroscopy 108 (2008). p. 1653.Google Scholar
[2] Yamashita, S, et al, Microscopy 64 (2015) 143. doi: 10.1093/jmicro/dfu115.Google Scholar
[3] Yamashita, S, et al, Microscopy 64 (2015) 409. doi: 10.1093/jmicro/dfv053.Google Scholar
[4] This study was partly supported by the JST Research Acceleration Program and the Nano Platform Program of MEXT, Japan. The authors thank Dr. Nagai, Mr. Kurashima and Ms. Ohwada for support in the STEM experiments.Google Scholar