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Quantitative Analysis of Electron Beam-Induced Destruction of Graphene Membranes under an Electron Microscope

Published online by Cambridge University Press:  23 November 2012

F. Eder ,
J.C. Meyer ,
S. Kurasch ,
U. Kaiser ,
V. Skakalova ,
J. Kotakoski ,
A.V. Krashenninikov  and
A. Chuvilin
F. Eder
Affiliation:
Physics of Nanostructured Materials, University of Vienna, Vienna, Vienna, Austria
J.C. Meyer
Affiliation:
Physics of Nanostructured Materials, University of Vienna, Vienna, Vienna, Austria
S. Kurasch
Affiliation:
University of Ulm, Central Facility of Electron Microscopy, Ulm, Baden Würtemberg, Germany
U. Kaiser
Affiliation:
University of Ulm, Central Facility of Electron Microscopy, Ulm, Baden Würtemberg, Germany
V. Skakalova
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Baden Würtemberg, Germany
J. Kotakoski
Affiliation:
University of Helsinki, Departement of Physics, Helsinki, Helsinki, Finland
A.V. Krashenninikov
Affiliation:
Aalto University, Departement of Applied Physics, Aalto, Helsinki, Finland
A. Chuvilin
Affiliation:
CIC nanoGUNE Consolider, Basque Foundation for Science, San Sebastian, Basque Country, Spain
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1500 - 1501
Copyright
Copyright © Microscopy Society of America 2012

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