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Quantitative Analysis and Interpretation of Atomic Force Microscopy (AFM) Phase Imaging

Published online by Cambridge University Press:  02 July 2020

D.N. Leonard ,
A.D. Batchelor  and
P.E. Russell
D.N. Leonard
Affiliation:
Dept. of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695
A.D. Batchelor
Affiliation:
Analytical Instrumentation Facility (AIF), North Carolina State University, Raleigh, NC, 27695
P.E. Russell
Affiliation:
Dept. of Materials Science and Engineering, Director- AIF, North Carolina State University, Raleigh, NC, 27695
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Extract

Gaps in the understanding and interpretation of data collected in various SPM modes are a direct result of the rapidly advancing scanning probe microscopy (SPM) technology. This systematic study is coupling classical metallurgical samples with a new surface variation mapping technique in an effort to further the quantitative comprehension of atomic force microscopy (AFM) phase imaging.

Phase imaging is a technique that has exhibited the ability to provide the microscopist with qualitative information of a material’s microstructure on the nanometer scale. Regions of a microstructure that exhibit incongruous mechanical properties like: friction, elastic modulus, composition, and viscoelasticity are displayed, in the resulting image, as regions of differing contrast. An example of this type of phase contrast is clearly seen in FIG. 1. A quantification of the phase shift will give new insight into the cause of the contrast mechanism, and reason for contrast reversal.

Type
Scanned Probe Microscopies: Technologies, Methodologies, and Applications
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1271 - 1272
Copyright
Copyright © Microscopy Society of America 1997

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References

1.Grigg, D.A., Microscopy and Microanalysis, 1996 852–853.10.1017/S0424820100166725CrossRefGoogle Scholar
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4. This project is being funded by the 1997 Microscopy Society of America's Undergraduate Research Scholarship, in conjunction with the Analytical Research Laboratory located on North Carolina State's Centennial Campus.Google Scholar