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Quantitative Aberration-corrected Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2004

L. Houben ,
C. L. Jia ,
K. Tillmann  and
K. Urban
L. Houben
Affiliation:
Research Centre Jülich, Germany
C. L. Jia
Affiliation:
Research Centre Jülich, Germany
K. Tillmann
Affiliation:
Research Centre Jülich, Germany
K. Urban
Affiliation:
Research Centre Jülich, Germany
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Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S03 , August 2004 , pp. 38 - 40
Copyright
© 2004 Microscopy Society of America

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