Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-28T15:19:30.550Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantifying Ordering Phenomena Through High-Resolution Electron Microscopy, Spectroscopy, and Simulation

Published online by Cambridge University Press:  25 July 2016

B.D. Esser ,
T.M. Smith ,
A.J. Hauser ,
R.E.A. Williams ,
F. Yang ,
M.J. Mills  and
D.W. McComb
B.D. Esser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
T.M. Smith
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
A.J. Hauser
Affiliation:
Department of Physics & Astronomy, University of Alabama, Tuscaloosa, AL, 35487, USA
R.E.A. Williams
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
F. Yang
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH, 43210, USA
M.J. Mills
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
D.W. McComb
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1448 - 1449
Copyright
© Microscopy Society of America 2016 

References

[1] Allen, L. J., Findlay, S. D., Lupini, a R., et al., Phys. Rev. Lett 91 (2003) 105503.CrossRefGoogle Scholar
[2] Nellist, P. D., D’Alfonso, a J. & Allen, L. J. J. Phys. Conf. Ser 371 (2012) 012054.CrossRefGoogle Scholar
[3] Maclaren, I. & Ramasse, Q. M. 59 (2014) 115–131.Google Scholar
[4] Smith, T. M., Esser, B. D., Antolin, N., et al, Acta Mater 100 (2015) 19–31.CrossRefGoogle Scholar
[5] Allen, L. J., D’Alfonso, a. J. & Findlay, S. D. Ultramicroscopy 151 (2014) 11–22.CrossRefGoogle Scholar
[6] Forbes, B. D., Martin, a. V, Findlay, S. D., et al., Phys. Rev. B - Condens. Matter Mater. Phys 82 (2010) 1–8.CrossRefGoogle Scholar
[7] Hwang, J., Zhang, J. Y., D,Alfonso, A. J., et al., Phys. Rev. Lett 111 (2013) 1–5.CrossRefGoogle Scholar
[8] Lim, T., Kim, S., Sung, K., et al., Nat. Publ. Gr (2016) 1–7.Google Scholar
[9] Niu, C., Zaddach, A. J., Oni, A. A., et al., Appl. Phys. Lett 106 (2015) 161906.CrossRefGoogle Scholar
[10] Hauser, A. J., Soliz, J. R., Dixit, M., et al., Phys. Rev. B 85 (2012) 161201.CrossRefGoogle Scholar
[11] Lucy, J. M., Ball, M. R., Restrepo, O. D., et al., Phys. Rev. B 90 (2014) 180401.CrossRefGoogle Scholar
[12] Morrow, R., Mishra, R., Restrepo, O. D., et al., J. Am. Chem. Soc 135 (2013) 18824–18830.CrossRefGoogle Scholar
[13] Funding for this research was provided by the Center for Emergent Materials at the Ohio State University, an NSF MRSEC (Award Number DMR-1420451), as well as partial support by an allocation of computing time from the Ohio Supercomputer Center.Google Scholar