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Quantifying Ordering Phenomena Through High-Resolution Electron Microscopy, Spectroscopy, and Simulation

Published online by Cambridge University Press:  25 July 2016

B.D. Esser ,
T.M. Smith ,
A.J. Hauser ,
R.E.A. Williams ,
F. Yang ,
M.J. Mills  and
D.W. McComb
B.D. Esser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
T.M. Smith
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
A.J. Hauser
Affiliation:
Department of Physics & Astronomy, University of Alabama, Tuscaloosa, AL, 35487, USA
R.E.A. Williams
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
F. Yang
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH, 43210, USA
M.J. Mills
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA
D.W. McComb
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1448 - 1449
Copyright
© Microscopy Society of America 2016 

References

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