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Quantifying Octahedral Rotations in Ultrathin LaNiO3 Films Using Position Averaged Convergent Beam Electron Diffraction

Published online by Cambridge University Press:  23 November 2012

J. Hwang ,
J.Y. Zhang ,
J. Son  and
S. Stemmer
J. Hwang
Affiliation:
University of California, Santa Barbara, Santa Barbara, CA
J.Y. Zhang
Affiliation:
University of California, Santa Barbara, Santa Barbara, CA
J. Son
Affiliation:
University of California, Santa Barbara, Santa Barbara, CA
S. Stemmer
Affiliation:
University of California, Santa Barbara, Santa Barbara, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1844 - 1845
Copyright
Copyright © Microscopy Society of America 2012

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