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Quantifying Local Structure of Complex Oxides Using Accurate and Precise Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

James M. LeBeau ,
Matthew Cabral ,
J. Houston Dycus ,
Everett Grimley ,
Shujun Zhang  and
Elizabeth Dickey
James M. LeBeau
Affiliation:
Department of Materials Science & Engineer, North Carolina State University, Raleigh NCUSA
Matthew Cabral
Affiliation:
Department of Materials Science & Engineer, North Carolina State University, Raleigh NCUSA
J. Houston Dycus
Affiliation:
Department of Materials Science & Engineer, North Carolina State University, Raleigh NCUSA
Everett Grimley
Affiliation:
Department of Materials Science & Engineer, North Carolina State University, Raleigh NCUSA
Shujun Zhang
Affiliation:
Institute for Superconducting & Electronic Materials, University of Wollongong, WollongongAustralia
Elizabeth Dickey
Affiliation:
Department of Materials Science & Engineer, North Carolina State University, Raleigh NCUSA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1638 - 1639
Copyright
© Microscopy Society of America 2017 

References

[1] Sang, X. & LeBeau, J. M. Ultramicroscopy 138 2014 28.CrossRefGoogle Scholar
[2] Dycus, J. H., et al, Microscopy and Microanalysis 21 2015 946.CrossRefGoogle Scholar
[3] Sang, X., Oni, A. A. & LeBeau, J. M. Microscopy and Microanalysis 20 2014 1764.CrossRefGoogle Scholar
[4] Sang, X., et al, J. M. Applied Physics Letters 106 2015 61913.CrossRefGoogle Scholar
[5] The authors acknowledge funding from the National Science Foundation (DMR-1608656), the Air Force Office of Scientific Research (FA9550-14-1-0182), and the NSF funded Center of Dielectrics and Piezoelectrics (IIP-1361503). The authors acknowledge the use of the Analytical Instrumentation Facility at NCSU, which is supported by the state of North Carolina and the National Science Foundation.Google Scholar