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Quantifying Elastic and Inelastic Electron Irradiation Damage in Transmission Electron Microscopy of 2D Materials

Published online by Cambridge University Press:  05 August 2019

Toma Susi ,
Tibor Lehnert ,
Ute Kaiser ,
Jannik Meyer  and
Jani Kotakoski
Toma Susi*
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Tibor Lehnert
Affiliation:
University of Ulm, Central Facility of Electron Microscopy, Ulm, Germany
Ute Kaiser
Affiliation:
University of Ulm, Central Facility of Electron Microscopy, Ulm, Germany
Jannik Meyer
Affiliation:
University of Tübingen, Institute of Applied Physics, Tübingen, Germany
Jani Kotakoski
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
*
*Corresponding author: [email protected]

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 454 - 455
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Tripathi, M et al. , Nano Letters 18 (2018), p. 5319.Google Scholar
[2]Su, C et al. , arXiv:1803.01369 (2019).Google Scholar
[3]Dyck, O et al. , Small 14 (2018), p. 1801771.Google Scholar
[4]Mustonen, K et al. , arXiv:1902.03972 (2019).Google Scholar
[5]Hudak, B et al. , ACS Nano 12 (2018), p. 5873.Google Scholar
[6]Susi, T et al. , Nature Communications 7 (2016), p. 13040.Google Scholar
[7]Susi, T et al. , 2D Materials 4 (2017), p. 042004.Google Scholar
[8]Lehnert, T et al. , Applied Physics Letters 110 (2017), p. 033106.Google Scholar
[9]Cretu, O et al. , Micron 72 (2015), p. 21.Google Scholar
[10]The work was funded by the European Research Council (ERC) Grant No. 756277-ATMEN.Google Scholar