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Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography

Published online by Cambridge University Press:  04 March 2011

N. Payraudeau*
Affiliation:
Department of Mechanical and Manufacturing Engineering, Trinity College Dublin, Dublin 2, Ireland
D. McGrouther
Affiliation:
S.U.P.A, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, United Kingdom
K.U. O'Kelly
Affiliation:
Department of Mechanical and Manufacturing Engineering, Trinity College Dublin, Dublin 2, Ireland
*
Corresponding author. E-mail: [email protected]
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Abstract

In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.

Type
Material Applications
Copyright
Copyright © Microscopy Society of America 2011

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References

REFERENCES

Claves, S.R., Bandar, A.R., Misiolek, W.Z. & Michael, J.R. (2004). Three-dimensional (3D) reconstruction of AlFeSi intermetallic particles in 6xxx aluminum alloys using the focused ion beam (FIB). Microsc Microanal 10, 11381139.CrossRefGoogle Scholar
Elfallagh, F. & Inkson, B.J. (2008). 3D tomographic analysis of crack morphologies in alumina and glass using FIB microscopy. J Phys Conf Ser 126, 14.CrossRefGoogle Scholar
Goldstein, J., Newbury, D., Joy, D., Lyman, C., Echlin, P., Lifshin, E., Sawyer, L. & Michael, J. (2003). Scanning Electron Microscopy and X-ray Microanalysis. New York: Springer.CrossRefGoogle Scholar
Holzapfel, C., Schaf, W., Marx, M., Vehoff, H. & Mucklich, F. (2007). Interaction of cracks with precipitates and grain boundaries: Understanding crack growth mechanisms through focused ion beam tomography. Scripta Mater 56, 697700.CrossRefGoogle Scholar
Holzer, L., Indutnyi, F., Gasser, P.H., Munch, B. & Wegmann, M. (2004). Three-dimensional analysis of porous BaTiO3 ceramics using FIB nanotomography. J Microsc 216, 8495.CrossRefGoogle ScholarPubMed
Inkson, B.J., Leclere, D., Elfallagh, F. & Derby, B. (2006). The effect of focused ion beam machining on residual stress and crack morphologies in alumina. J Phys Conf Ser 26, 219222.CrossRefGoogle Scholar
Inkson, B.J., Wu, H.Z., Steer, T. & Möbus, G. (2001). 3D mapping of subsurface cracks in alumina using FIB. Mater Res Soc Symp Proc 649, Q3.7.Google Scholar
Kammer, D., Mendoza, R., Barnett, S.A. & Voorhees, P.W. (2005). The three-dimensional microstructure of materials: Measurement and analysis. Microsc Microanal 11, 7273.Google Scholar
Kato, M., Ito, T., Aoyama, Y., Sawa, K., Kaneko, T., Kawase, N. & Jinnai, H. (2007). Three-dimensional structural analysis of a block copolymer by scanning electron microscopy combined with a focused ion beam. J Polymer Sci B: Polymer Phys 45, 677683.CrossRefGoogle Scholar
Kremer, J.R., Mastronarde, D.N. & McIntosh, J.R. (1996). Computer visualization of three-dimensional image data using IMOD. J Struct Biol 116, 7176.CrossRefGoogle ScholarPubMed
Matthijs De Winter, D.A., Schneijdenberg, C.T.W.M., Lebbink, M.N., Lich, B., Verkleij, A.J., Drury, M.R. & Humbel, B.M. (2009). Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging. J Microsc 233, 372383.CrossRefGoogle Scholar
McGrouther, D. & Munroe, P.R. (2007). Imaging and analysis of 3-D structure using a dual beam FIB. Microsc Res Techniq 70, 186194.CrossRefGoogle ScholarPubMed
Schaffer, M., Wagner, J., Schaffer, B., Schmied, M. & Mulders, H. (2007). Automated three-dimensional X-ray analysis using a dual-beam FIB. Ultramicroscopy 107, 587597.CrossRefGoogle ScholarPubMed
Steer, T.J., Möbus, G., Kraft, O., Wagner, T. & Inkson, B.J. (2001). 3D FIB and AFM mapping of nanoindentation zones. Mater Res Soc Symp Proc 649, 3.3.13.3.6.Google Scholar
Steer, T.J., Möbus, G., Kraft, O., Wagner, T. & Inkson, B.J. (2002). 3-D-focused ion beam mapping of nanoindentation zones in a Cu-Ti multilayered coating. Thin Solid Films 413, 147154.CrossRefGoogle Scholar
Uchic, M.D., Groeber, M.A., Dimiduk, D.M. & Simmons, J.P. (2006). 3D microstructural characterization of nickel superalloys via serial-sectioning using a dual beam FIB-SEM. Scripta Mater 55, 2328.CrossRefGoogle Scholar
Williams, R., Bhattacharyya, D., Viswanathan, G.B., Banerjee, R. & Fraser, H.L. (2004). Application of FIB-tomography to the study of microstructures in titanium alloys. Microsc Microanal 10(S2), 11781179 (CD-ROM).CrossRefGoogle Scholar
Williams, R., Uchic, M., Dimiduk, D. & Fraser, H.L. (2006). Three dimensional reconstruction of alpha laths in alpha/beta titanium alloys by serial sectioning with a FEI NOVA 600. Microsc Microanal 12(S2), 12341235 (CD-ROM).CrossRefGoogle Scholar
Xie, Z.H., Munroe, P.R., McGrouther, D., Singh, R.K., Hoffman, M., Bendavid, A., Martin, P.J. & Yew, S. (2006). Three-dimensional study of indentation-induced cracks in an amorphous carbon coating on a steel substrate. J Mater Res 21, 26002610.CrossRefGoogle Scholar