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Quantification of ADF STEM Image Data for Nanoparticle Structure and Strain Measurements

Published online by Cambridge University Press:  25 July 2016

P D Nellist ,
L Jones ,
A Varambhia ,
A De Backer ,
S Van Aert  and
D Ozkaya
P D Nellist
Affiliation:
Department of Materials, University of Oxford, 16 Parks Road, Oxford, UK
L Jones
Affiliation:
Department of Materials, University of Oxford, 16 Parks Road, Oxford, UK
A Varambhia
Affiliation:
Department of Materials, University of Oxford, 16 Parks Road, Oxford, UK
A De Backer
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp, Belgium.
S Van Aert
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171, Antwerp, Belgium.
D Ozkaya
Affiliation:
Johnson Matthey Technology Centre, Sonning Common, Reading, UK.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 896 - 897
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Jones, L & Conf., IOP Ser.: Mater. Sci. Eng 109 (2016) 012008.Google Scholar
[2] H E et al Ultramicroscopy 133 (2013) 109–119.CrossRefGoogle Scholar
[3] De Backer, A., et al, Ultramicroscopy 151 (2015) 56–61.Google Scholar
[4] Jones, L., et al, Nano Letters 14 (2014) 6336–6341.Google Scholar
[5] Jones, L., et al, Advanced Structural and Chemical Imaging 1 (2015) 8.Google Scholar
[6] The research leading to these results has received funding from the EU FP7 (grant agreement 312483-ESTEEM2, Integrated Infrastructure Initiative-I3), the UK EPSRC (grant number EP/K032518/1), the Research Foundation Flanders (FWO, Belgium) through a research grant to ADB and is also partly supported by Johnson-Matthey.Google Scholar