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Quantification and Sensible Correction for Energy-Loss- and Thickness-Dependent Contrast Complications in Atomic-Scale Electron Energy-Loss Spectroscopy

Published online by Cambridge University Press:  25 July 2016

Huolin L. Xin
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY, USA
Haiyan Tan
Affiliation:
Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland, USA
Christian Dwyer
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ, USA
Ye Zhu
Affiliation:
Monash Centre for Electron Microscopy and Department of Materials Engineering, Monash University, Victoria, Australia

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

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[6] H.L.X. acknowledges support from Center for Functional Nanomaterials, Brookhaven National Laboratory, which is supported by the U.S. Department of Energy, Office of Basic Energy Sciences, under Contract No. DE-AC02-98CH10886. This work made use of the electron microscopy facility of the Cornell Center for Materials Research (CCMR) with support from the National Science Foundation Materials Research Science and Engineering Centers (MRSEC) program (Contract No. DMR 1120296). Experimental data recording, and H.L.X. for that period, was supported by the Energy Materials Center at Cornell (emc2), an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Basic Energy Sciences, under Award No. DESC0001086. H.T. acknowledges financial support from Centre d’Elaboration de Materiaux et d’Etudes Structurales, CNRS, and National Institute of Standards and Technology, USA.Y.Z. and C.D. gratefully acknowledge financial support from the Australian Research Council (Grant No. DP110104734). C.D. acknowledges support from the Ernst Ruska Centre.Google Scholar