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“Push-Button Microscopy”: Automated Instrument Alignment and Reciprocal-space Navigation using PyJEM

Published online by Cambridge University Press:  22 July 2022

Surui Huang
Affiliation:
Lehigh University, Computer Science and Engineering, Bethlehem, Pennsylvania, USA
Jack Kellerk
Affiliation:
Lehigh University, Computer Science and Engineering, Bethlehem, Pennsylvania, USA
Brian Chen
Affiliation:
Lehigh University, Computer Science and Engineering, Bethlehem, Pennsylvania, USA
Aparna Bharati
Affiliation:
Lehigh University, Computer Science and Engineering, Bethlehem, Pennsylvania, USA
Masashi Watanabe*
Affiliation:
Lehigh University, Materials Science and Engineering, Bethlehem, Pennsylvania, USA
Patrick Cantwell
Affiliation:
Lehigh University, Nano\Human Interface Initiative, Bethlehem, Pennsylvania, USA
Chris Marvel
Affiliation:
Lehigh University, Materials Science and Engineering, Bethlehem, Pennsylvania, USA
Martin Harmer
Affiliation:
Lehigh University, Materials Science and Engineering, Bethlehem, Pennsylvania, USA
*
*Corresponding author: [email protected]

Abstract

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Type
On Demand - Artificial Intelligence, Instrument Automation, and High-Dimensional Data Analytics for Microscopy and Microanalysis
Copyright
Copyright © Microscopy Society of America 2022

References

Watanabe, M., Microscopy, 63 (2013), p. 217.CrossRefGoogle Scholar
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Olszta, M. and Fiedle, K., Microscopy and Microanalysis, 26 (2020), p. 32.CrossRefGoogle Scholar
This work was financially supported by the Presidential Nano-Human Interfaces Initiative at Lehigh University, under the oversight of President John D. Simon and Provost Patrick V. Farrell. The author (MW) wishes to acknowledge financial support from the NSF through grants DMR-2018683.Google Scholar