Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-27T05:31:46.920Z Has data issue: false hasContentIssue false
  • English
  • Français

Project Tomo: Toward Atomic-scale Analytical Tomography

Published online by Cambridge University Press:  30 July 2020

Thomas Kelly ,
Rafal Dunin-Borkowski  and
Joachim Meyer
Thomas Kelly
Affiliation:
Steam Instruments, Inc., Madison, Wisconsin, United States
Rafal Dunin-Borkowski
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Joachim Meyer
Affiliation:
Rhineland Westfalia Technical University (RWTH), Aachen, Nordrhein-Westfalen, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2618 - 2621
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Xu, R, Chen, C-C, Wu, L, Scott, MC, Theis, W, Ophus, C, Bartels, M, Yang, Y, Ramezani-Dakhel, H, Sawaya, MR, Heinz, H, Marks, LD, Ercius, P, Miao, J (2015) Three-dimensional coordinates of individual atoms in materials revealed by electron tomography. Nat Mater.10.1038/nmat4426CrossRefGoogle ScholarPubMed
Yang, Y, Chen, C-C, Scott, MC, Ophus, C, Xu, R, Pryor, A, Wu, L, Sun, F, Theis, W, Zhou, J, Eisenbach, M, Kent, PRC, Sabirianov, RF, Zeng, H, Ercius, P, Miao, J (2017) Deciphering chemical order/disorder and material properties at the single-atom level. Nature 542:75–79.10.1038/nature21042CrossRefGoogle ScholarPubMed
Kelly, TF, Miller, MK, Rajan, K, Ringer, SP (2013) Atomic-Scale Tomography: a 2020 Vision. Microsc Microanal 19:652–66410.1017/S1431927613000494CrossRefGoogle ScholarPubMed
McDermott, RF, Suttle, JR (2015) US Patent: System and Method for Characterizing Ions Using a Superconducting Transmission Line Detector. US Patent 9490112Google Scholar
Suttle, J (2018) A Superconducting Ion Detector. Ph.D., The University of Wisconsin - MadisonGoogle Scholar
We put 100% in quotation marks because all real experiments have noise and other limitations. We expect to approach the ideal of 100% with detection efficiencies that may be 99.9%, for example.Google Scholar
Migunov, V, London, A, Farle, M and Dunin-Borkowski R, E (2015) Model-independent measurement of the charge density in an Fe atom probe needle using off-axis electron holography without mean inner potential effects. J. Appl. Phys. 117: 134301.10.1063/1.4916609CrossRefGoogle Scholar
Zheng, F, Caron, J, Migunov, V, Beleggia, M, Pozzi, G and Dunin-Borkowski, R E (2020) Charge density measurement in nanoscale materials using off-axis electron holography. Journal of Electron Spectroscopy and Related Phenomena, in press.10.1016/j.elspec.2019.07.002CrossRefGoogle Scholar
Wu, M, Tafel, A, Hommelhoff, P and Spiecker, E (2019) Determination of 3D electrostatic field at an electron nano-emitter. Appl. Phys. Lett. 114: 013101.10.1063/1.5055227CrossRefGoogle Scholar
https://www.thermofisher.com/us/en/home/industrial/electron-microscopy/electron-microscopy-instruments-workflow-solutions/spectra-300-s-tem.htmlGoogle Scholar
Project Tomo is funded as part of the Ernst Ruska-Centre 2.0 project, which is funded by the federal and state ministries in Germany and the Helmholtz Association.Google Scholar