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Progress on the Development of DEPFET Based SDD and MPD Detectors

Published online by Cambridge University Press:  09 April 2017

J Treis ,
K Heinzinger ,
K Hermenau ,
S Herrmann ,
T Lauf ,
P Lechner ,
G Lutz ,
P Majewski ,
M Porro  and
R Richter
...Show all authors
J Treis
Affiliation:
PNDetector GmbH, Germany
K Heinzinger
Affiliation:
PNSensor GmbH, Germany
K Hermenau
Affiliation:
PNSensor GmbH, Germany
S Herrmann
Affiliation:
Max Planck Institut Halbleiterlabor, Germany
T Lauf
Affiliation:
Max Planck Institut Halbleiterlabor, Germany
P Lechner
Affiliation:
PNSensor GmbH, Germany
G Lutz
Affiliation:
PNSensor GmbH, Germany
P Majewski
Affiliation:
PNSensor GmbH, Germany
M Porro
Affiliation:
Max Planck Institut Halbleiterlabor, Germany
R Richter
Affiliation:
Max Planck Institut Halbleiterlabor, Germany
G Schaller
Affiliation:
Max Planck Institut Halbleiterlabor, Germany
F Schopper
Affiliation:
Max Planck Institut Halbleiterlabor, Germany
H Soltau
Affiliation:
PNSensor GmbH, Germany
L Strüder
Affiliation:
Max Planck Institut Halbleiterlabor, Germany
G de Vita
Affiliation:
Max Planck Institut Halbleiterlabor, Germany

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1202 - 1203
Copyright
Copyright © Microscopy Society of America 2011