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Progress in X-ray Mapping in Electron Microscopes Toward Single-Atom Analysis

Published online by Cambridge University Press:  04 August 2017

M. Watanabe
M. Watanabe*
Affiliation:
Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA, USA.

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1014 - 1015
Copyright
© Microscopy Society of America 2017 

References

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[10] The author wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229, and would like to thank to Dr. Peter Duncumb for providing useful information and reviewing this paper..Google Scholar