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ProcessDiffraction VI.2: New possibilities in manipulating electron diffraction ring patterns

Published online by Cambridge University Press:  02 July 2020

János L. Lábár
Affiliation:
Research Institute for Technical Physics and Materials Science, H-l 121 Budapest, Konkoly-Thege u.29-33, Hungary
Miklós Adamik
Affiliation:
Research Institute for Technical Physics and Materials Science, H-l 121 Budapest, Konkoly-Thege u.29-33, Hungary
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Abstract

A free computer program was introduced recently to process electron diffraction ring patterns. The program (called ProcessDiffraction) produces XDR-like output from the digitized version of the measured diffraction patterns. The enhanced functionality of V1.2 is summarized in the present paper.

  1. 1. The program starts with a hint-window giving suggestions what can be done next. Hints change permanently as processing progresses. The hint-window can be switched off optionally. It is a complement to the Windows-style Help-system.

  2. 2. The center of the rings is found by manually shifting the measured pattern until it overlaps with a generated reference circle. The computer can further refine the position of the center.

  3. 3. Elliptical distortion of the measured pattern (NOT of the display, which is irrelevant) is corrected by adjusting the eccentricity and axis direction of the reference ellipse (distorted from the reference circle) until visually coincide with the measured ring.

Type
Diffraction Techniques in TEM and SEM
Copyright
Copyright © Microscopy Society of America 2001

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References

1Lábár, JL, Proceedings of 12th European Congress on Electron Microscopy, Brno, 2000, I 379Google Scholar
2Walck, Scott, Proceedings of M&M, 1998Google Scholar