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Probing Two-dimensional (Bi,Sb)2Te3/h-BN Heterostructures Using Complementary S/TEM and Simulation Techniques

Published online by Cambridge University Press:  04 August 2017

Danielle Reifsnyder Hickey ,
Joon Sue Lee ,
Ryan J. Wu ,
Nitin Samarth  and
K. Andre Mkhoyan
Danielle Reifsnyder Hickey
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States
Joon Sue Lee
Affiliation:
Department of Physics, The Pennsylvania State University, University Park, PA 16802, United States
Ryan J. Wu
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States
Nitin Samarth
Affiliation:
Department of Physics, The Pennsylvania State University, University Park, PA 16802, United States
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1760 - 1761
Copyright
© Microscopy Society of America 2017 

References

[1] Mellnik, AR, et al, Nature 511 2014). p. 449.Google Scholar
[2] Li, CH, et al, Nat. Nanotech 9 2014). p. 218.Google Scholar
[3] Lee, JS, et al, Phys. Rev. B 92 2015 155312.Google Scholar
[4] Jamali, M, et al, Nano Lett. 15 2015). p. 7126.Google Scholar
[5] Kirkland, EJ Advanced Computing in Electron Microscopy, 2nd ed. New York 2010.Google Scholar
[6] The authors gratefully acknowledge funding provided by C-SPIN, one of six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA.Google Scholar