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Probing the Unique Radiation Damage Response of Oxide Interfaces Using Multi-modal STEM Imaging, Diffraction, and Spectroscopy

Published online by Cambridge University Press:  30 July 2020

Steven Spurgeon ,
Bethany Matthews ,
Tiffany Kaspar ,
Weilin Jiang ,
Jonathan Gigax ,
Lin Shao ,
Vaithiyalingam Shutthanandan  and
Michel Sassi
Steven Spurgeon
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Bethany Matthews
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Tiffany Kaspar
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Weilin Jiang
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Jonathan Gigax
Affiliation:
Texas A&M University, College Station, Texas, United States
Lin Shao
Affiliation:
Texas A&M University, College Station, Texas, United States
Vaithiyalingam Shutthanandan
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Michel Sassi
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States

Abstract

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Type
Advanced Characterization of Nuclear Fuels and Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1666 - 1667
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Copyright
Copyright © Microscopy Society of America 2020

References

Spurgeon, S. R. et al. Advanced Materials Interfaces (2020). DOI:10.1002/admi.20190194410.1002/admi.201901944CrossRefGoogle Scholar