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Probing the Intrinsic Bending Stiffness of 2D Multilayers and Heterostructures Using Aberration-corrected STEM
Published online by Cambridge University Press: 30 July 2020
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- New Frontiers in Electron Microscopy of Two-dimensional Materials
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- Copyright
- Copyright © Microscopy Society of America 2020
References
Akinwande, D., et al. Extreme Mechanics Letters 13, 42–77 (2017).10.1016/j.eml.2017.01.008CrossRefGoogle Scholar
Poot, M., and van der Zant, H. S. J. Applied Physics Letters 92, 063111 (2008).10.1063/1.2857472CrossRefGoogle Scholar
This work was supported by NSF-MRSEC award no. DMR-1720633 and the Materials Research Laboratory Central Facilities at the University of Illinois.Google Scholar
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