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Probing Nanostructures Site by Site with the Aberration-Corrected STEM

Published online by Cambridge University Press:  28 July 2003

S. J. Pennycook ,
A. R. Lupini ,
M. Varela ,
A. Borisevich ,
Y. Peng ,
R. Buczko ,
X. Fan ,
J. R. McBride ,
T. C. Kippeny  and
S. J. Rosenthal
...Show all authors
S. J. Pennycook
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Department of Physics and Astronomy, Vanderbilt University, Nashville, TN
A. R. Lupini
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
M. Varela
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
A. Borisevich
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
Y. Peng
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
R. Buczko
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Department of Physics and Astronomy, Vanderbilt University, Nashville, TN Institute of Physics, Polish Academy of Sciences, 02-668 Warsaw, Poland
X. Fan
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Center for Advanced Microscopy, Michigan State University, East Lansing, MI
J. R. McBride
Affiliation:
Department of Chemistry, Vanderbilt University, Nashville, TN
T. C. Kippeny
Affiliation:
Department of Chemistry, Vanderbilt University, Nashville, TN
S. J. Rosenthal
Affiliation:
Department of Chemistry, Vanderbilt University, Nashville, TN
A. Franceschetti
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Department of Physics and Astronomy, Vanderbilt University, Nashville, TN
S. T. Pantelides
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Department of Physics and Astronomy, Vanderbilt University, Nashville, TN

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 2 - 3
Copyright
Copyright © Microscopy Society of America 2003