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Probing Material Dynamics with an SEM at Nanometer Length and Picosecond Time-scales

Published online by Cambridge University Press:  22 July 2022

Vasudevan Iyer  and
Benjamin J. Lawrie
Vasudevan Iyer*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Benjamin J. Lawrie
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Ultrashort Pulse Lasers: Microscopy, Simulations, and Material Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 880
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Copyright
Copyright © Microscopy Society of America 2022

References

Garfinkel, D. A., Iyer, V., Seils, R., Pakeltis, G., Bourgeois, M. R., Rossi, A. W., Klein, C., Lawrie, B. J., Masiello, D. J., and Rack, P. D., ACS Appl. Nano Mater. acsanm.1c03171 (2022).Google Scholar
Iyer, V., Phang, Y. S., Butler, A., Chen, J., Lerner, B., Argyropoulos, C., Hoang, T., and Lawrie, B., APL Photonics 6, 106103 (2021).10.1063/5.0065524CrossRefGoogle Scholar
Taylor, E. J., Iyer, V., Dhami, B. S., Klein, C., Lawrie, B. J., and Appavoo, K., ArXiv:2201.06546 [Cond-Mat] (2022).Google Scholar
The cathodoluminescence and pulsed electron beam experiments were conducted at the Center for Nanophase Materials Sciences (Oak Ridge National Laboratory), which is a DOE Office of Science User Facility.Google Scholar