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Probing Device-relevant Defects in van der Waals Layered Materials

Published online by Cambridge University Press:  30 July 2020

Danielle Reifsnyder Hickey
Danielle Reifsnyder Hickey*
Affiliation:
Pennsylvania State University, State College, Pennsylvania, United States

Abstract

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Type
Advances in Electron Microscopy to Characterize Materials Embedded in Devices
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1618 - 1619
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Copyright
Copyright © Microscopy Society of America 2020

References

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Reifsnyder Hickey, D. et al. , Phys. Rev. Mater. 4 (2020) 011201(R).Google Scholar
Reifsnyder Hickey, D. et al. , Phys. Rev. Mater. 3 (2019) 061201(R).Google Scholar
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The author gratefully acknowledges funding provided by C-SPIN, one of six STARnet program research centers, and by the 2D Crystal Consortium–Materials Innovation Platform (2DCC-MIP) under NSF cooperative agreement DMR-1539916.Google Scholar