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Prevention Beats Removal: Avoiding Stripe Artifacts from Current Variation in Particle Beam Microscopy Through Time-Resolved Sensing

Published online by Cambridge University Press:  30 July 2021

Luisa Watkins ,
Sheila Seidel ,
Minxu Peng ,
Akshay Agarwal ,
Christopher Yu  and
Vivek Goyal
Luisa Watkins
Affiliation:
Boston University, United States
Sheila Seidel
Affiliation:
Boston University, United States
Minxu Peng
Affiliation:
Boston University, United States
Akshay Agarwal
Affiliation:
Massachusetts Institute of Technology, United States
Christopher Yu
Affiliation:
Draper Laboratory, United States
Vivek Goyal
Affiliation:
Boston University, Boston, Massachusetts, United States

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 422 - 425
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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