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Preparation of samples: Why use Ga, Xe or photons?
Published online by Cambridge University Press: 30 July 2021
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- Type
- Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
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- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Bassim, N., Scott, K., and Giannuzzi, L.A., Mrs Bulletin, 2014. 39(4): p. 317-325.CrossRefGoogle Scholar
Giannuzzi, L. and Michael, J.,. Microscopy and Microanalysis, 2020. 26(S2): p. 792-793.CrossRefGoogle Scholar
Smith, N., et al. , Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 2006. 24(6): p. 2902-2906.CrossRefGoogle Scholar
Randolph, S.J., et al. , Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 2018. 36(6): p. 06JB01.Google Scholar
Echlin, M.P., et al. , Current Opinion in Solid State and Materials Science, 2020. 24(2): p. 100817.CrossRefGoogle Scholar