Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Prosa, Ty J.
and
Larson, David J.
2017.
Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography.
Microscopy and Microanalysis,
Vol. 23,
Issue. 2,
p.
194.
Barnes, J.P.
Grenier, A.
Mouton, I.
Barraud, S.
Audoit, G.
Bogdanowicz, J.
Fleischmann, C.
Melkonyan, D.
Vandervorst, W.
Duguay, S.
Rolland, N.
Vurpillot, F.
and
Blavette, D.
2018.
Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives.
Scripta Materialia,
Vol. 148,
Issue. ,
p.
91.
Gault, Baptiste
Breen, Andrew J.
Chang, Yanhong
He, Junyang
Jägle, Eric A.
Kontis, Paraskevas
Kürnsteiner, Philipp
Kwiatkowski da Silva, Alisson
Makineni, Surendra Kumar
Mouton, Isabelle
Peng, Zirong
Ponge, Dirk
Schwarz, Torsten
Stephenson, Leigh T.
Szczepaniak, Agnieszka
Zhao, Huan
and
Raabe, Dierk
2018.
Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations.
Journal of Materials Research,
Vol. 33,
Issue. 23,
p.
4018.
Kong, Charlie
Cheong, Soshan
and
Tilley, Richard D.
2019.
Comprehensive Nanoscience and Nanotechnology.
p.
327.
Halpin, J.E.
Webster, R.W.H.
Gardner, H.
Moody, M.P.
Bagot, P.A.J.
and
MacLaren, D.A.
2019.
An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focussed ion beam.
Ultramicroscopy,
Vol. 202,
Issue. ,
p.
121.
Perrin-Pellegrino, Carine
Dumont, Myriam
Keita, Mohamed Fadel
Neisius, Thomas
Mikaelian, Georges
Mangelinck, Dominique
Carlot, Gaëlle
and
Maugis, Philippe
2020.
Characterization by APT and TEM of Xe nano-bubbles in CeO2.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 469,
Issue. ,
p.
24.
Qiao, Yi
Zhao, Yalong
Zhang, Zheng
Liu, Binbin
Li, Fusheng
Tong, Huan
Wu, Jintong
Zhou, Zhanqi
Xu, Zongwei
and
Zhang, Yue
2021.
Single-Wedge Lift-Out for Atom Probe Tomography Al/Ni Multilayers Specimen Preparation Based on Dual-Beam-FIB.
Micromachines,
Vol. 13,
Issue. 1,
p.
35.
Preiß, Eva I.
Merle, Benoit
Xiao, Yuan
Gannott, Florentina
Liebig, Jan P.
Wheeler, Jeffrey M.
and
Göken, Mathias
2021.
Applicability of focused Ion beam (FIB) milling with gallium, neon, and xenon to the fracture toughness characterization of gold thin films.
Journal of Materials Research,
Vol. 36,
Issue. 12,
p.
2505.
Eder, Katja
Bhatia, Vijay
Qu, Jiangtao
Van Leer, Brandon
Dutka, Mikhail
and
Cairney, Julie M.
2021.
A multi-ion plasma FIB study: Determining ion implantation depths of Xe, N, O and Ar in tungsten via atom probe tomography.
Ultramicroscopy,
Vol. 228,
Issue. ,
p.
113334.
Famelton, J.R.
Hughes, G.M.
Williams, C.A.
Barbatti, C.
Moody, M.P.
and
Bagot, P.A.J.
2021.
Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an α-Al(Fe,Mn)Si dispersoid.
Materials Characterization,
Vol. 178,
Issue. ,
p.
111194.
Zhong, Xiangli
Wade, C. Austin
Withers, Philip J.
Zhou, Xiaorong
Cai, Changrun
Haigh, Sarah J.
and
Burke, M. Grace
2021.
Comparing Xe+pFIB and Ga+FIB for TEM sample preparation of Al alloys: Minimising FIB‐induced artefacts.
Journal of Microscopy,
Vol. 282,
Issue. 2,
p.
101.
Tunes, Matheus A.
Quick, Cameron R.
Stemper, Lukas
Coradini, Diego S. R.
Grasserbauer, Jakob
Dumitraschkewitz, Phillip
Kremmer, Thomas M.
and
Pogatscher, Stefan
2021.
A Fast and Implantation-Free Sample Production Method for Large Scale Electron-Transparent Metallic Samples Destined for MEMS-Based In Situ S/TEM Experiments.
Materials,
Vol. 14,
Issue. 5,
p.
1085.
Gault, Baptiste
Chiaramonti, Ann
Cojocaru-Mirédin, Oana
Stender, Patrick
Dubosq, Renelle
Freysoldt, Christoph
Makineni, Surendra Kumar
Li, Tong
Moody, Michael
and
Cairney, Julie M.
2021.
Atom probe tomography.
Nature Reviews Methods Primers,
Vol. 1,
Issue. 1,
Lindgren, Kristina
Dömstedt, Peter
Szakalos, Peter
and
Thuvander, Mattias
2022.
The Nanostructure of the Oxide Formed on Fe–10Cr–4Al Exposed in Liquid Pb.
Microscopy and Microanalysis,
Vol. 28,
Issue. 4,
p.
1321.
Halpin, John E.
Jenkins, Benjamin
Moody, Michael P.
Webster, Robert W.H.
Bos, Jan-Willem G.
Bagot, Paul A.J.
and
MacLaren, Donald A.
2022.
A Correlative Study of Interfacial Segregation in a Cu-Doped TiNiSn Thermoelectric half-Heusler Alloy.
ACS Applied Electronic Materials,
Vol. 4,
Issue. 9,
p.
4446.
Razaghi, Zhina
Xie, Dong Yue
Lin, Ming-hui
and
Zhu, Guo-zhen
2022.
Ion beam-induced bending of TiO2 nanowires with bead-like and prismatic shapes.
RSC Advances,
Vol. 12,
Issue. 9,
p.
5577.
Rielli, Vitor Vieira
Theska, Felix
and
Primig, Sophie
2022.
Correlative Approach for Atom Probe Sample Preparation of Interfaces Using Plasma Focused Ion Beam Without Lift-Out.
Microscopy and Microanalysis,
Vol. 28,
Issue. 4,
p.
998.
Allen, Frances I
Blanchard, Paul T
Lake, Russell
Pappas, David
Xia, Deying
Notte, John A
Zhang, Ruopeng
Minor, Andrew M
and
Sanford, Norman A
2023.
Fabrication of Specimens for Atom Probe Tomography Using a Combined Gallium and Neon Focused Ion Beam Milling Approach.
Microscopy and Microanalysis,
Vol. 29,
Issue. 5,
p.
1628.
Makineni, Surendra Kumar
2023.
New Horizons in Metallurgy, Materials and Manufacturing.
p.
17.
Saksena, Aparna
Sun, Binhan
Dong, Xizhen
Khanchandani, Heena
Ponge, Dirk
and
Gault, Baptiste
2024.
Optimizing site-specific specimen preparation for atom probe tomography by using hydrogen for visualizing radiation-induced damage.
International Journal of Hydrogen Energy,
Vol. 50,
Issue. ,
p.
165.