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Predictive Structure-Property Correlations for SrtiO3 Grain Boundaries

Published online by Cambridge University Press:  02 July 2020

Pradyumna L. Prabhumirashi ,
Kevin D. Johnson  and
Vinayak P. Dravid
Pradyumna L. Prabhumirashi
Affiliation:
Department of Materials Science & Engineering, Northwestern University, Evanston, IL, 60208.
Kevin D. Johnson
Affiliation:
Intel Corporation, Hillsboro, OR, 97124.
Vinayak P. Dravid
Affiliation:
Department of Materials Science & Engineering, Northwestern University, Evanston, IL, 60208.
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Abstract

In polycrystalline materials the trapping of charge at interfaces has a decisive influence on the electrical transport properties through the formation of electrostatic potential barriers. This can either be an intrinsic phenomenon or can be related to impurity segregation leading to complex defect centers. This plays a key role in technologically important systems, especially those having electrically active interfaces, e.g.,p-n junctions in semiconductors and grain boundaries in electroceramics.

Electroceramic oxides such as ZnO and SrTiO3 are common systems that exhibit the tendency of current control by internal potential barriers. While bulk measurements, either electrical (e.g. P-E, C-V, I-V), or optical (e.g. Raman) have contributed significantly to the understanding of charged interfaces, there are a very few direct observations of electrical activity at a nanometer level. For instance, it has been recognized that space charge and dopant segregation at the grain boundary are inter-related.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 292 - 293
Copyright
Copyright © Microscopy Society of America 2001

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References

References:

1. See, Grain Boundary Phenomena in Electroceramics, Adv. in. Ceramics, Vol. 1, (Ed. Levinson, L. and Hill, D.), AcerS Publ., Columbus, OH, 1986.Google Scholar
2.Johnson, K. D. and Dravid, V. P., Appl. Phys. Lett., 74(4), 1999, p. 621-23.CrossRefGoogle Scholar
3.Ravikumar, V., Rodrigues, R. P., and Dravid, V. P., Phys. Rev. Lett, 75(22), 1995, p. 4063-66.CrossRefGoogle Scholar
4.Ravikumar, V., Rodrigues, R. P., and Dravid, V. P., J. Amer. Ceram. Soc, 80 (5), 1997, p. 1117-30.CrossRefGoogle Scholar
5.Ravikumar, V., Rodrigues, R. P., and Dravid, V. P., J. Amer. Ceram. Soc, 80 (5), 1997, p. 1131-38.CrossRefGoogle Scholar
6.This research is supported by the U. S. Department of Energy, Office of Basic Energy Sciences, under Grant No.Google Scholar